Review Article

Electronic structure analyses of BN network materials using high energy-resolution spectroscopy methods based on transmission electron microscopy

  1. M. Terauchi*

Article first published online: 22 MAY 2006

DOI: 10.1002/jemt.20323

Issue

Microscopy Research and Technique

Microscopy Research and Technique

Special Issue: “Nanomaterials Characterization Using Microscopy—Part II”

Volume 69, Issue 7, pages 531–537, July 2006

Additional Information

How to Cite

Terauchi, M. (2006), Electronic structure analyses of BN network materials using high energy-resolution spectroscopy methods based on transmission electron microscopy. Microsc. Res. Tech., 69: 531–537. doi: 10.1002/jemt.20323

Author Information

  1. Institute for Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan

*Institute for Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan

Publication History

  1. Issue published online: 26 JUN 2006
  2. Article first published online: 22 MAY 2006
  3. Manuscript Accepted: 19 JAN 2005
  4. Manuscript Received: 2 AUG 2004

Funded by

  • Ministry of Education, Science, Sports and Culture of Japan. Grant Numbers: 12440079, 13554010

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