Review Article

Focused ion beams techniques for nanomaterials characterization

  1. Richard M. Langford*

Article first published online: 31 MAY 2006

DOI: 10.1002/jemt.20324

Issue

Microscopy Research and Technique

Microscopy Research and Technique

Special Issue: “Nanomaterials Characterization Using Microscopy—Part II”

Volume 69, Issue 7, pages 538–549, July 2006

Additional Information

How to Cite

Langford, R. M. (2006), Focused ion beams techniques for nanomaterials characterization. Microsc. Res. Tech., 69: 538–549. doi: 10.1002/jemt.20324

Author Information

  1. Physics Department, Trinity College, Dublin, Ireland

*Materials Science Centre, School of Materials, University of Manchester, Grosvenor Street, Manchester, UK M1 7HS

Publication History

  1. Issue published online: 26 JUN 2006
  2. Article first published online: 31 MAY 2006
  3. Manuscript Accepted: 21 NOV 2004
  4. Manuscript Received: 20 JUL 2004

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