Review Article

Application of magnetic force microscopy in nanomaterials characterization

  1. Alex de Lozanne*

Article first published online: 26 MAY 2006

DOI: 10.1002/jemt.20325

Issue

Microscopy Research and Technique

Microscopy Research and Technique

Special Issue: “Nanomaterials Characterization Using Microscopy—Part II”

Volume 69, Issue 7, pages 550–562, July 2006

Additional Information

How to Cite

de Lozanne, A. (2006), Application of magnetic force microscopy in nanomaterials characterization. Microsc. Res. Tech., 69: 550–562. doi: 10.1002/jemt.20325

Author Information

  1. Department of Physics, Center for Nano and Molecular Science and Technology, and Texas Materials Institute, University of Texas, Austin, Texas 78712

*Physics Department RLM 5.208, 1 University Station C1600, Austin, TX 78712-0264, USA

Publication History

  1. Issue published online: 26 JUN 2006
  2. Article first published online: 26 MAY 2006
  3. Manuscript Accepted: 15 FEB 2005
  4. Manuscript Received: 22 JUN 2004

Funded by

  • National Science Foundation
  • Texas Advanced Research and Technology Programs
  • R.A. Welch Foundation

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Keywords:

  • magnetic materials;
  • nanostructures;
  • magnetic force microscopy;
  • scanning probe microscopy

Abstract

This review describes the basic technical aspects of magnetic force microscopy and how this technique has been applied to the study of colossal magnetoresistance materials, superconductors, and patterned magnetic materials. Recently, current distribution in a patterned aluminum strip has been measured by magnetic force microscopy, opening the possibility of measuring currents in buried interconnects in integrated circuits. Microsc. Res. Tech., 2006. © 2006 Wiley-Liss, Inc.

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