Review Article

Field-enhanced scanning near-field optical microscopy†

  1. Alexandre Bouhelier*

Article first published online: 12 JUN 2006

DOI: 10.1002/jemt.20328

Issue

Microscopy Research and Technique

Microscopy Research and Technique

Special Issue: “Nanomaterials Characterization Using Microscopy—Part II”

Volume 69, Issue 7, pages 563–579, July 2006

Additional Information

How to Cite

Bouhelier, A. (2006), Field-enhanced scanning near-field optical microscopy. Microsc. Res. Tech., 69: 563–579. doi: 10.1002/jemt.20328

Author Information

  1. Center for Nanoscale Materials and Chemistry Division, Argonne National Laboratory, Argonne, Illinois 60439

*Laboratoire de Physique de l'Université de Bourgogne, UMR 5027, Faculté des Sciences Mirande 9, Avenue Alain Savary, B.P. 47870, F-21078 DIJON Cedex, France

  1. †

    The U.S. Government retains for itself, and others acting on its behalf, a paid-up, nonexclusive, irrevocable worldwide license in the said article to reproduce, prepare derivative works, distribute copies to the public, and perform publicly and display publicly, by or on behalf of the Government.

Publication History

  1. Issue published online: 26 JUN 2006
  2. Article first published online: 12 JUN 2006
  3. Manuscript Accepted: 15 APR 2005
  4. Manuscript Received: 12 OCT 2004

Funded by

  • Division of Materials Sciences, The Office of Basic Energy Sciences, U.S. Department of Energy. Grant Number: W-31-109-ENG-38

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Keywords:

  • electromagnetic enhancement;
  • surface plasmons;
  • multiphoton microscopy;
  • Raman microscopy;
  • optical resolution

Abstract

This manuscript reviews the principles and recent advances of scanning near-field optical microscopy based on tip-induced field enhancement. These scanning microscopes utilize minute probes to locally enhance an electromagnetic field through a complex interplay between surface plasmon excitation and localization of electric charges by geometrical singularities. The necessary conditions leading to an electromagnetic enhancement will be reviewed, as well as the means to characterize it. A brief account of the theoretical framework will be given, together with applications of the technique ranging from chemical imaging to nanolithography. Microsc. Res. Tech., 2006. © 2006 Wiley-Liss, Inc.

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