MRT letter: Full-tilt electron tomography with a piezo-actuated rotary drive
Article first published online: 29 SEP 2008
Copyright © 2008 Wiley-Liss, Inc.
Microscopy Research and Technique
Volume 71, Issue 11, pages 773–777, November 2008
How to Cite
Xu, X.J., Lockwood, A., Guan, W., Gay, R., Saghi, Z., Wang, J.J., Peng, Y., Inkson, B.J. and Möbus, G. (2008), MRT letter: Full-tilt electron tomography with a piezo-actuated rotary drive. Microsc. Res. Tech., 71: 773–777. doi: 10.1002/jemt.20645
- Issue published online: 24 OCT 2008
- Article first published online: 29 SEP 2008
- Manuscript Accepted: 26 AUG 2008
- Manuscript Received: 11 JUL 2008
- RCUK/EPSRC Basic Technology Programme, UK. Grant Number: GR/S85689/01
- specimen holder;
Piezoelectric nanoactuation, which is rapidly becoming established as state-of-the-art positioning control in transmission electron microscopy (TEM), is extended here to include a rotational degree of freedom. A piezoelectric goniometer with both translational and rotary drive action has been designed with high level of miniaturization to fit into a standard TEM specimen holder shaft without compromising any of the performance of the default TEM goniometer and without any modifications to the TEM. Enhanced functionality of such a goniometer-in-goniometer is outlined and experimental results for electron tomography of nanostructures over a full tilt range of views, without any missing angles, are demonstrated. Microsc. Res. Tech., 2008. © 2008 Wiley-Liss, Inc.