Advances in atomic resolution in situ environmental transmission electron microscopy and 1Å aberration corrected in situ electron microscopy

Authors

  • Pratibha L. Gai,

    Corresponding author
    1. Department of Chemistry, University of York, Nanocentre, York YO10 5DD, United Kingdom
    2. Department of Physics, University of York, Nanocentre, York YO10 5DD, United Kingdom
    • Departments of Chemistry and Physics, University of York, Nanocentre, York YO10 5DD, United Kingdom
    Search for more papers by this author
  • Edward D. Boyes

    1. Department of Physics, University of York, Nanocentre, York YO10 5DD, United Kingdom
    2. Department of Electronics, University of York, Nanocentre, York YO10 5DD, United Kingdom
    Search for more papers by this author

Abstract

Advances in atomic resolution in situ environmental transmission electron microscopy for direct probing of gas-solid reactions, including at very high temperatures (∼2000°C) are described. In addition, recent developments of dynamic real time in situ studies at the Angstrom level using a hot stage in an aberration corrected environment are presented. In situ data from Pt/Pd nanoparticles on carbon with the corresponding FFT/optical diffractogram illustrate an achieved resolution of 0.11 nm at 500°C and higher in a double aberration corrected TEM/STEM instrument employing a wider gap objective pole piece. The new results open up opportunities for dynamic studies of materials in an aberration corrected environment. Microsc. Res. Tech., 2009. © 2009 Wiley-Liss, Inc.

Ancillary