Research Article

Influence of atomic force microscopy acquisition parameters on thin film roughness analysis

  1. Radu Hristu1,
  2. Stefan G. Stanciu1,
  3. George A. Stanciu1,*,
  4. İnci Çapan2,
  5. Burcu Güner2,
  6. Matem Erdoğan2

Article first published online: 24 FEB 2012

DOI: 10.1002/jemt.22014

Issue

Microscopy Research and Technique

Microscopy Research and Technique

Volume 75, Issue 7, pages 921–927, July 2012

Additional Information

How to Cite

Hristu, R., Stanciu, S. G., Stanciu, G. A., Çapan, İ., Güner, B. and Erdoğan, M. (2012), Influence of atomic force microscopy acquisition parameters on thin film roughness analysis. Microsc. Res. Tech., 75: 921–927. doi: 10.1002/jemt.22014

Author Information

  1. 1

    Center for Microscopy-Microanalysis and Information Processing, University Politehnica of Bucharest, 060042 Bucharest, Romania

  2. 2

    Science and Arts Faculty, Department of Physics, Balikesir University, 10100 Balikesir, Turkey

*Center for Microscopy-Microanalysis and Information Processing, University Politehnica of Bucharest, 313 Splaiul Independentei, 060042 Bucharest, Romania

Publication History

  1. Issue published online: 19 JUN 2012
  2. Article first published online: 24 FEB 2012
  3. Manuscript Accepted: 15 DEC 2011
  4. Manuscript Received: 20 OCT 2011

Funded by

  • CNCSIS–UEFISCDI. Grant Number: 726/2009
  • ANCS Bilateral Cooperation Program. Grant Number: 414/2010
  • TUBITAK Bilateral Cooperation Programme. Grant Number: 109T612

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Keywords:

  • gas sensing properties;
  • scanning probe microscopy;
  • surface roughness;
  • porphyrin thin films

Abstract

A reliable procedure for measuring parameters connected to surface roughness is needed to compare the gas sensing properties of various thin films or the effect of different fabrication procedures on the surface roughness and the sensing properties. In this article, we propose to investigate how the acquisition parameters specific to atomic force microscopy investigations such as pixel size, scan area and scan speed influence the roughness parameters, namely root mean square and surface area ratio, commonly used for characterizing the gas sensing properties of porphyrins and other materials. Microsc. Res. Tech. 2012. © 2012 Wiley Periodicals, Inc.

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