Microscopy Research and Technique

Cover image for Vol. 64 Issue 5‐6

Special Issue: Nanomaterials Characterization Using Microscopy—Part I

August 2004

Volume 64, Issue 5-6

Pages 345–458

Issue edited by: Chuanbin Mao

  1. Editorial

    1. Top of page
    2. Editorial
    3. Review Articles
  2. Review Articles

    1. Top of page
    2. Editorial
    3. Review Articles
    1. Coherent nano-area electron diffraction (pages 347–355)

      J.M. Zuo, M. Gao, J. Tao, B.Q. Li, R. Twesten and I. Petrov

      Version of Record online: 17 NOV 2004 | DOI: 10.1002/jemt.20096

    2. Nanoscale lead and noble gas inclusions in aluminum: Structures and properties (pages 356–372)

      Erik Johnson, Hans Henrik Andersen and Ulrich Dahmen

      Version of Record online: 17 NOV 2004 | DOI: 10.1002/jemt.20097

    3. Imaging and analysis of nanowires (pages 373–389)

      David C. Bell, Yue Wu, Carl J. Barrelet, Silvija Gradečak, Jie Xiang, Brian P. Timko and Charles M. Lieber

      Version of Record online: 17 NOV 2004 | DOI: 10.1002/jemt.20093

    4. Off-axis electron holography of magnetic nanowires and chains, rings, and planar arrays of magnetic nanoparticles (pages 390–402)

      Rafal E. Dunin-Borkowski, Takeshi Kasama, Alexander Wei, Steven L. Tripp, Martin J. Hÿtch, Etienne Snoeck, Richard J. Harrison and Andrew Putnis

      Version of Record online: 17 NOV 2004 | DOI: 10.1002/jemt.20098

    5. Application of scanning probe microscopy to the characterization and fabrication of hybrid nanomaterials (pages 415–434)

      Mark E. Greene, C. Reagan Kinser, Donald E. Kramer, Liam S.C. Pingree and Mark C. Hersam

      Version of Record online: 17 NOV 2004 | DOI: 10.1002/jemt.20100

    6. Creating nanoscopic collagen matrices using atomic force microscopy (pages 435–440)

      Fengzhi Jiang, Khaled Khairy, Kate Poole, Jonathon Howard and Daniel J. Müller

      Version of Record online: 17 NOV 2004 | DOI: 10.1002/jemt.20101

    7. Probing photonic and optoelectronic structures by Apertureless Scanning Near-Field Optical Microscopy (pages 441–452)

      Renaud Bachelot, Gilles Lerondel, Sylvain Blaize, Sebastien Aubert, Aurelien Bruyant and Pascal Royer

      Version of Record online: 17 NOV 2004 | DOI: 10.1002/jemt.20102

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