Microscopy Research and Technique

Cover image for Vol. 72 Issue 3

Special Issue: In Situ Electron Microscopy Methods

March 2009

Volume 72, Issue 3

Pages 121–292

Issue edited by: Blythe G. Clark, Paulo Ferreira, Ian M. Robertson

  1. Editorial

    1. Top of page
    2. Editorial
    3. Review Articles
    1. In situ electron microscopy methods (page 121)

      Blythe G. Clark, Paulo Ferreira and Ian M. Robertson

      Version of Record online: 7 JAN 2009 | DOI: 10.1002/jemt.20663

  2. Review Articles

    1. Top of page
    2. Editorial
    3. Review Articles
    1. Laser-based in situ techniques: Novel methods for generating extreme conditions in TEM samples (pages 122–130)

      Mitra L. Taheri, Thomas Lagrange, Bryan W. Reed, Michael R. Armstrong, Geoffrey H. Campbell, William J. DeHope, Judy S. Kim, Wayne E. King, Daniel J. Masiel and Nigel D. Browning

      Version of Record online: 22 JAN 2009 | DOI: 10.1002/jemt.20664

    2. Femtosecond electron diffraction: Direct probe of ultrafast structural dynamics in metal films (pages 131–143)

      Shouhua Nie, Xuan Wang, Junjie Li, Richard Clinite and Jianming Cao

      Version of Record online: 7 JAN 2009 | DOI: 10.1002/jemt.20666

    3. In situ TEM of radiation effects in complex ceramics (pages 165–181)

      Jie Lian, L.M. Wang, Kai Sun and Rodney C. Ewing

      Version of Record online: 7 JAN 2009 | DOI: 10.1002/jemt.20669

    4. In situ transmission electron microscopy and ion irradiation of ferritic materials (pages 182–186)

      Marquis A. Kirk, Peter M. Baldo, Amelia C.Y. Liu, Edward A. Ryan, Robert C. Birtcher, Zhongwen Yao, Sen Xu, Michael L. Jenkins, Mercedes Hernandez-Mayoral, Djamel Kaoumi and Arthur T. Motta

      Version of Record online: 2 FEB 2009 | DOI: 10.1002/jemt.20670

    5. In situ TEM observation of magnetic materials (pages 187–196)

      Mihaela Tanase and Amanda K. Petford-Long

      Version of Record online: 22 JAN 2009 | DOI: 10.1002/jemt.20671

    6. LEEM investigations of surfaces using a beam of energetic self-ions (pages 197–207)

      Michal Ondrejcek, Wacek Swiech, Ivan Petrov, Mahesh Rajappan and C. Peter Flynn

      Version of Record online: 23 JAN 2009 | DOI: 10.1002/jemt.20672

    7. A new MEMS-based system for ultra-high-resolution imaging at elevated temperatures (pages 208–215)

      Lawrence F. Allard, Wilbur C. Bigelow, Miguel Jose-Yacaman, David P. Nackashi, John Damiano and Stephen E. Mick

      Version of Record online: 22 JAN 2009 | DOI: 10.1002/jemt.20673

    8. In situ observation of oxidation of liquid droplets of tin and melting behavior of a tin particle covered with a tin oxide layer (pages 223–231)

      Takayuki Mima, Hironori Takeuchi, Shigeo Arai, Keisuke Kishita, Kotaro Kuroda and Hiroyasu Saka

      Version of Record online: 20 JAN 2009 | DOI: 10.1002/jemt.20675

    9. In situ SEM indentation experiments: Instruments, methodology, and applications (pages 242–249)

      Rudy Ghisleni, Karolina Rzepiejewska-Malyska, Laetitia Philippe, Patrick Schwaller and Johann Michler

      Version of Record online: 12 JAN 2009 | DOI: 10.1002/jemt.20677

    10. In situ deformation of thin films on substrates (pages 270–283)

      Marc Legros, Martiane Cabié and Daniel S. Gianola

      Version of Record online: 2 FEB 2009 | DOI: 10.1002/jemt.20680

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