Special Feature
Multi-turn time-of-flight mass spectrometers with electrostatic sectors
Article first published online: 3 NOV 2003
DOI: 10.1002/jms.546
Copyright © 2003 John Wiley & Sons, Ltd.
Additional Information
How to Cite
Toyoda, M., Okumura, D., Ishihara, M. and Katakuse, I. (2003), Multi-turn time-of-flight mass spectrometers with electrostatic sectors. Journal of Mass Spectrometry, 38: 1125–1142. doi: 10.1002/jms.546
Publication History
- Issue published online: 12 NOV 2003
- Article first published online: 3 NOV 2003
- Manuscript Accepted: 10 SEP 2003
- Manuscript Received: 19 JUL 2003
Funded by
- Ministry of Education, Science, Sports and Culture. Grant Numbers: 09559012, 10044085, 11559012, 13559005.
- Institute of Space and Astronautical Science.
- Yamada Science Foundation.
- Abstract
- Article
- References
- Cited By
Keywords:
- multi-turn time-of-flight mass spectrometer;
- perfect focusing;
- compact;
- high mass resolution
Abstract
The mass resolution of a time-of-flight (TOF) mass spectrometer is directly proportional to its total flight pathlength. Multi-turn or multi-passage ion optical geometries are necessary to obtain fight distances of sufficient length within reasonable size limitations. We have investigated ion optics for a multi-turn TOF mass spectrometer with electrostatic sectors. The concept of ‘perfect’ focusing conditions is introduced. Furthermore, a new type of multi-turn TOF mass spectrometer, the MULTUM Linear plus, was developed. It consists of four cylindrical electric sectors and 28 electric quadrupole lenses. It has a vacuum chamber 60 × 70 × 20 cm in size. Mass resolution is demonstrated to increase according to the number of ion cycles. A mass resolution of 350 000 (m/z = 28, FWHM) was achieved after 501.5 cycles. The MULTUM Linear plus analyzer is not simple, however; 28 electric quadrupole lenses are used. In order to reduce the number of ion optical parts, an improved multi-turn TOF mass spectrometer, the MULTUM II, consisting of only four toroidal electric sectors, was also developed. The possibility of tandem mass spectrometric applications using multi-turn TOF mass spectrometers is also discussed. Copyright © 2003 John Wiley & Sons, Ltd.

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