Research Article
Efficient estimation of adjoint-variable S-parameter sensitivities with time domain TLM
Article first published online: 6 JAN 2005
DOI: 10.1002/jnm.571
Copyright © 2005 John Wiley & Sons, Ltd.
Issue
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International Journal of Numerical Modelling: Electronic Networks, Devices and Fields
Volume 18, Issue 2, pages 171–187, March/April 2005
Additional Information
How to Cite
Bakr, M. H. and Nikolova, N. K. (2005), Efficient estimation of adjoint-variable S-parameter sensitivities with time domain TLM. Int. J. Numer. Model., 18: 171–187. doi: 10.1002/jnm.571
Publication History
- Issue published online: 7 FEB 2005
- Article first published online: 6 JAN 2005
- Manuscript Accepted: 1 OCT 2004
- Manuscript Revised: 1 SEP 2004
- Manuscript Received: 1 APR 2004
Funded by
- National Sciences and Engineering Research Council of Canada. Grant Numbers: OGP0249780-02, OGP0227660-03
- Abstract
- References
- Cited By
Keywords:
- TLM method;
- electromagnetic modelling;
- sensitivity analysis;
- field-based synthesis;
- CAD
Abstract
We present a novel algorithm for efficient estimation of S-parameter sensitivities with the time-domain transmission line modelling (TLM) method. The original electromagnetic structure is simulated using TLM to obtain the S-parameters in the desired frequency band. For each port, an adjoint TLM simulation that runs backward in time is derived and solved. The sensitivities of the S-parameters in the desired frequency band are estimated using only the original and adjoint simulations. For a structure with Np ports and n designable parameters, our approach requires only Np additional simulations regardless of n. This can be easily contrasted with the 2nNp additional simulations required by the central difference approximation. Our algorithm is illustrated through the estimation of S-parameter sensitivities with respect to the dimensions of waveguide discontinuities. Very good match is obtained between our sensitivity estimates and those obtained using central difference approximation. Copyright © 2005 John Wiley & Sons, Ltd.

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