Fast estimation of RL-loaded microelectronic interconnections delay for the signal integrity prediction
Article first published online: 22 NOV 2011
Copyright © 2011 John Wiley & Sons, Ltd.
International Journal of Numerical Modelling: Electronic Networks, Devices and Fields
Volume 25, Issue 4, pages 338–346, July/August 2012
How to Cite
Ravelo, B. and Eudes, T. (2012), Fast estimation of RL-loaded microelectronic interconnections delay for the signal integrity prediction. Int. J. Numer. Model., 25: 338–346. doi: 10.1002/jnm.838
- Issue published online: 18 JUN 2012
- Article first published online: 22 NOV 2011
- Manuscript Accepted: 27 SEP 2011
- Manuscript Revised: 14 JUN 2011
- Manuscript Received: 7 JAN 2011
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