Raman study of Fano interference in p-type doped silicon
Version of Record online: 19 FEB 2010
Copyright © 2010 John Wiley & Sons, Ltd.
Journal of Raman Spectroscopy
Volume 41, Issue 12, pages 1759–1764, December 2010
How to Cite
Burke, B. G., Chan, J., Williams, K. A., Wu, Z., Puretzky, A. A. and Geohegan, D. B. (2010), Raman study of Fano interference in p-type doped silicon. J. Raman Spectrosc., 41: 1759–1764. doi: 10.1002/jrs.2614
- Issue online: 16 DEC 2010
- Version of Record online: 19 FEB 2010
- Manuscript Accepted: 17 DEC 2009
- Manuscript Received: 27 OCT 2009
- Scientific User Facilities Division
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- U.S. Department of Energy
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