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Raman analyses of co-phasing and hysteresis behaviors in V2O3 thin film

Authors

  • Xiang-Bai Chen,

    Corresponding author
    • Department of Nano Science and Mechanical Engineering and Nanotechnology Research Center, Konkuk University, Chungju, Korea
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  • Jun-Hwan Shin,

    1. School of Advanced Device Technology, University of Science and Technology (UST), Daejeon, Korea
    2. Creative Research Center for Metal–Insulator Transition, Electronic and Telecommunication Research Institute (ETRI), Daejeon, Korea
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  • Hyun-Tak Kim,

    1. School of Advanced Device Technology, University of Science and Technology (UST), Daejeon, Korea
    2. Creative Research Center for Metal–Insulator Transition, Electronic and Telecommunication Research Institute (ETRI), Daejeon, Korea
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  • Yong-Sik Lim

    1. Department of Nano Science and Mechanical Engineering and Nanotechnology Research Center, Konkuk University, Chungju, Korea
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Xiang-Bai Chen, Department of Nano Science and Mechanical Engineering and Nanotechnology Research Center, Konkuk University, Chungju 380–701, Korea.

E-mail: xchen@kku.ac.kr

Abstract

We present the studies of the phase transition behaviors of V2O3 thin film using temperature-dependent Raman scattering spectroscopy. Our results show that in both the cooling and heating processes of V2O3 thin film, the phase transition occurs gradually but not suddenly, contrary to that in single crystal. The coexistence of both the metal and insulator phases with co-phasing ΔTc larger than 30 K is observed in both the cooling and heating processes. We discuss that this large co-phasing ΔTc should be distinguished with the large hysteresis ΔTh reported in nanostructures. In addition, our discussions indicate that co-phasing ΔTc and hysteresis ΔTh would be mainly correlated with stress and defect states in sample, respectively. Furthermore, our Raman analyses suggest that stress would also induce phase transitions in V2O3, and the stress (pressure)-induced phase transitions would behave differently comparing with the temperature-induced transitions under normal pressure. Copyright © 2012 John Wiley & Sons, Ltd.

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