Molecular orientation analysis of organic thin films by z-polarization Raman microscope
Article first published online: 11 AUG 2012
Copyright © 2012 John Wiley & Sons, Ltd.
Journal of Raman Spectroscopy
Volume 43, Issue 12, pages 2029–2034, December 2012
How to Cite
Mino, T., Saito, Y., Yoshida, H., Kawata, S. and Verma, P. (2012), Molecular orientation analysis of organic thin films by z-polarization Raman microscope. J. Raman Spectrosc., 43: 2029–2034. doi: 10.1002/jrs.4118
- Issue published online: 14 DEC 2012
- Article first published online: 11 AUG 2012
- Manuscript Accepted: 29 APR 2012
- Manuscript Revised: 25 APR 2012
- Manuscript Received: 15 FEB 2012
- polarization Raman microscopy;
- molecular orientation;
- organic thin film
Polarization-dependent Raman microscopy is a powerful technique to perform both structural and chemical analyses with submicron spatial resolution. In conventional Raman microscopy, the polarization measurements are limited only in the direction parallel to the sample plane. In this work, we overcome the limit of conventional measurements by controlling the incident polarization by a spatially modulated waveplate. In this method, the polarization perpendicular to the sample surface (z-polarization) can be detected together with the parallel polarization (xy-polarization). Because of this unique polarization control, our Raman microscope has the ability to image the molecular orientation, together with the molecular analysis. Here, we have investigated thin films of pentacene molecules that are widely studied as an organic semiconductor material. The orientations of pentacene molecules are imaged with a spatial resolution of 300 nm. Our results clearly indicate that the lamellar grains show the lower tilt angles compared to the neighboring islands, which has not been proved in conventional methods. The substrate effects and the thickness dependence of the film are also studied. These results provide knowledge about the relationship between the devise performance and the film structures, which is indispensable for future device exploitations. Copyright © 2012 John Wiley & Sons, Ltd.