Enhanced Fröhlich interaction of semiconductor cuprous oxide films determined by temperature-dependent Raman scattering and spectral transmittance
Article first published online: 15 JUL 2012
Copyright © 2012 John Wiley & Sons, Ltd.
Journal of Raman Spectroscopy
Volume 44, Issue 1, pages 142–146, January 2013
How to Cite
Yu, W., Han, M., Jiang, K., Duan, Z., Li, Y., Hu, Z. and Chu, J. (2013), Enhanced Fröhlich interaction of semiconductor cuprous oxide films determined by temperature-dependent Raman scattering and spectral transmittance. J. Raman Spectrosc., 44: 142–146. doi: 10.1002/jrs.4145
- Issue published online: 9 JAN 2013
- Article first published online: 15 JUL 2012
- Manuscript Accepted: 10 JUN 2012
- Manuscript Revised: 6 JUN 2012
- Manuscript Received: 19 APR 2012
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