Ultraviolet tip-enhanced nanoscale Raman imaging
Article first published online: 11 SEP 2012
Copyright © 2012 John Wiley & Sons, Ltd.
Journal of Raman Spectroscopy
Volume 43, Issue 12, pages 1931–1934, December 2012
How to Cite
Park, K.-D., Kim, Y. H., Park, J.-H., Park, J. S., Lee, H. S., Yim, S.-Y., Lee, Y. H. and Jeong, M. S. (2012), Ultraviolet tip-enhanced nanoscale Raman imaging. J. Raman Spectrosc., 43: 1931–1934. doi: 10.1002/jrs.4158
- Issue published online: 14 DEC 2012
- Article first published online: 11 SEP 2012
- Manuscript Accepted: 15 JUN 2012
- Manuscript Received: 28 MAR 2012
- tip-enhanced Raman scattering (TERS);
- near-field scanning optical microscope (NSOM);
- ultraviolet (UV);
- carbon nanotube film
We have constructed an ultraviolet (UV)-apertureless near-field scanning optical microscope-Raman spectroscopy system by using an aluminum tip for the simultaneous measurement of topography and Raman scattering of nanomaterials with high spatial resolution. The topography, Rayleigh scattering image, and tip-enhanced Raman scattering image of the carbon nanotube film showed that a spatial resolution of around 19 nm was achieved. This spatial resolution of UV-Raman mapping image exceeds that of previous approaches, which have several hundred nanometers of spatial resolution. Copyright © 2012 John Wiley & Sons, Ltd.