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Keywords:

  • tip-enhanced Raman scattering (TERS);
  • near-field scanning optical microscope (NSOM);
  • ultraviolet (UV);
  • aluminum;
  • carbon nanotube film

We have constructed an ultraviolet (UV)-apertureless near-field scanning optical microscope-Raman spectroscopy system by using an aluminum tip for the simultaneous measurement of topography and Raman scattering of nanomaterials with high spatial resolution. The topography, Rayleigh scattering image, and tip-enhanced Raman scattering image of the carbon nanotube film showed that a spatial resolution of around 19 nm was achieved. This spatial resolution of UV-Raman mapping image exceeds that of previous approaches, which have several hundred nanometers of spatial resolution. Copyright © 2012 John Wiley & Sons, Ltd.