Ultraviolet tip-enhanced nanoscale Raman imaging

Authors


Young Hee Lee, WCU Department of Energy Science, Department of Physics, Sungkyunkwan University (SKKU), Suwon, 440-746 Korea.

E-mail: leeyoung@skku.edu

Mun Seok Jeong, Advanced Photonics Research Institute, Gwangju Institute of Science and Technology, Gwangju 500-712, Korea.

E-mail: mjeong@gist.ac.kr

Abstract

We have constructed an ultraviolet (UV)-apertureless near-field scanning optical microscope-Raman spectroscopy system by using an aluminum tip for the simultaneous measurement of topography and Raman scattering of nanomaterials with high spatial resolution. The topography, Rayleigh scattering image, and tip-enhanced Raman scattering image of the carbon nanotube film showed that a spatial resolution of around 19 nm was achieved. This spatial resolution of UV-Raman mapping image exceeds that of previous approaches, which have several hundred nanometers of spatial resolution. Copyright © 2012 John Wiley & Sons, Ltd.

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