Imaging of internal stress around a mineral inclusion in a sapphire crystal: application of micro-Raman and photoluminescence spectroscopy
Version of Record online: 2 OCT 2012
Copyright © 2012 John Wiley & Sons, Ltd.
Journal of Raman Spectroscopy
Volume 44, Issue 1, pages 147–154, January 2013
How to Cite
Noguchi, N., Abduriyim, A., Shimizu, I., Kamegata, N., Odake, S. and Kagi, H. (2013), Imaging of internal stress around a mineral inclusion in a sapphire crystal: application of micro-Raman and photoluminescence spectroscopy. J. Raman Spectrosc., 44: 147–154. doi: 10.1002/jrs.4161
- Issue online: 9 JAN 2013
- Version of Record online: 2 OCT 2012
- Manuscript Accepted: 8 JUL 2012
- Manuscript Revised: 3 JUL 2012
- Manuscript Received: 24 APR 2012
Supporting information may be found in the online version of this article.
|jrs_4161_sm_f1.TIF||TIFF image||172K||Figure S1. Numerical model of the P–T evolution for zircon, rutile, and albite inclusions in a sapphire crystal taken from southeastern Australia (SEA). The model uses Eq. 21 of Zhang, in which a host and an inclusion are postulated to be spherical and isotropic, and behave as a perfect elastic body. For the calculation, the bulk moduli and volume thermal expansion coefficients of the sapphire and the inclusions in Table 1 were used, and the shear modulus of sapphire was set to 166 GPa, which represents the Voigt average of the elastic stiffness constant. We postulate that the P–T path for the exhumation of the sapphire grain follows the ancient geothermal gradient in SEA. The initial diameters of the host sapphire and inclusions are 1 cm and 0.1 mm, respectively. The P–T conditions for the formation of the sapphire were assumed to be 0.92 GPa and 900°C corresponding to the lower crust condition.|
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