Probing crystallographic orientation of a single GaN nanotube using polarized Raman imaging
Article first published online: 16 FEB 2013
Copyright © 2013 John Wiley & Sons, Ltd.
Journal of Raman Spectroscopy
Volume 44, Issue 5, pages 651–654, May 2013
How to Cite
Patsha, A., Sahoo, P., Dhara, S., Amirthapandian, S. and Tyagi, A. K. (2013), Probing crystallographic orientation of a single GaN nanotube using polarized Raman imaging. J. Raman Spectrosc., 44: 651–654. doi: 10.1002/jrs.4262
- Issue published online: 10 MAY 2013
- Article first published online: 16 FEB 2013
- Manuscript Accepted: 9 JAN 2013
- Manuscript Revised: 10 DEC 2012
- Manuscript Received: 5 OCT 2012
- polarized Raman scattering;
- Raman imaging
We report the study of crystallographic orientation of a highly anisotropic square-shaped single wurtzite GaN nanotube (NT) probed by polarized Raman imaging. The polarization-dependent Raman intensities are collected in two mutually orthogonal directions with respect to the NT long axis. Variation in intensities of symmetry allowed A1(LO) mode of GaN with two different polarization directions reveals the possible crystalline orientations in the NT. The polarized Raman spectral imaging illustrates the fact of inhomogeneous crystalline orientations along the edges of the NT facets owing to its finite wall thickness. The deviation of polarization selection rule for GaN is attributed to the geometrical anisotropy of the NT. Electron microscopic structural data confirms the spectral imaging analyses. Copyright © 2013 John Wiley & Sons, Ltd.