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Spectroscopic characterization of graphene films grown on Pt(111) surface by chemical vapor deposition of ethylene

Authors


  • This article is from the GISR part of the joint special issue on the European Conference on Nonlinear Optical Spectroscopy (ECONOS 2012) with Guest Editors Johannes Kiefer and Peter Radi and the II Italian Conference of the National Group of Raman Spectroscopy and Non-Linear Effects (GISR 2012) with Guest Editor Maria Grazia Giorgini.

Abstract

This work reports the peculiar properties of a graphene film prepared by the chemical vapor deposition of ethylene in high vacuum on a well oriented and carefully cleaned Pt(111) crystal surface maintained at high temperature. In-situ and ex-situ characterization techniques (low-energy electron diffraction, high-resolution electron energy loss spectroscopy, scanning electron microscopy and Raman micro-spectroscopy) used here indicate the prevalence of single-layer regions and the presence of two different orientations of the graphene sheets with respect to the Pt(111) substrate. In most of the deposited area, evidence is found of a compressive stress for the graphene lattice, as a net result of the growth process on a metal substrate. This graphene film grown on Pt(111) exhibits a lower degree of order and of homogeneity with respect to the exfoliated graphene on Si/SiO2, as it is found generally for graphene on metals, but several characterization techniques indicate a better quality than in previous deposition experiments on the same metal substrate. Copyright © 2013 John Wiley & Sons, Ltd.

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