Sub-micron imaging of sub-surface nanocrystalline structure in silicon
Article first published online: 23 AUG 2013
Copyright © 2013 John Wiley & Sons, Ltd.
Journal of Raman Spectroscopy
Volume 44, Issue 11, pages 1523–1528, November 2013
How to Cite
Xu, S., Tang, X., Yue, Y. and Wang, X. (2013), Sub-micron imaging of sub-surface nanocrystalline structure in silicon. J. Raman Spectrosc., 44: 1523–1528. doi: 10.1002/jrs.4366
- Issue published online: 8 NOV 2013
- Article first published online: 23 AUG 2013
- Manuscript Accepted: 16 JUL 2013
- Manuscript Revised: 21 JUN 2013
- Manuscript Received: 4 MAR 2013
- National Science Foundation. Grant Numbers: 0926704, 1200397, 1235852
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