Enhancement of lattice defect signatures in graphene and ultrathin graphite using tip-enhanced Raman spectroscopy
Version of Record online: 22 NOV 2013
Copyright © 2013 John Wiley & Sons, Ltd.
Journal of Raman Spectroscopy
Volume 45, Issue 1, pages 15–21, January 2014
How to Cite
Rickman, R. H. and Dunstan, P. R. (2014), Enhancement of lattice defect signatures in graphene and ultrathin graphite using tip-enhanced Raman spectroscopy. J. Raman Spectrosc., 45: 15–21. doi: 10.1002/jrs.4416
- Issue online: 16 JAN 2014
- Version of Record online: 22 NOV 2013
- Manuscript Accepted: 28 OCT 2013
- Manuscript Revised: 9 SEP 2013
- Manuscript Received: 20 MAY 2013
- Welsh European Funding Office
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