These authors contributed equally.
In-situ Raman spectroscopy of current-carrying graphene microbridge
Version of Record online: 20 JAN 2014
Copyright © 2014 John Wiley & Sons, Ltd.
Journal of Raman Spectroscopy
Volume 45, Issue 2, pages 168–172, February 2014
How to Cite
Choi, M., Son, J., Choi, H., Shin, H.-J., Lee, S., Kim, S., Lee, S., Kim, S., Lee, K.-R., Kim, S. J., Hong, B. H., Hong, J. and Yang, I.-S. (2014), In-situ Raman spectroscopy of current-carrying graphene microbridge. J. Raman Spectrosc., 45: 168–172. doi: 10.1002/jrs.4442
- Issue online: 6 FEB 2014
- Version of Record online: 20 JAN 2014
- Manuscript Accepted: 7 DEC 2013
- Manuscript Revised: 6 DEC 2013
- Manuscript Received: 4 SEP 2013
- Korea government (MSIP). Grant Number: 2009-0063320
- Samsung Electronics Co., Basic Science Research Program. Grant Number: NRF-2013R1A1A2013745
- Pioneer Research Center Program. Grant Number: 2013-008914
- Ministry of Trade, Industry, and Energy. Grant Number: 10044723
- Converging Research Center Program through the Ministry of Science, IT, and Future Planning. Grant Number: 2012K001314
- in-situ Raman spectroscopy;
- Joule heating;
In-situ Raman spectroscopy was performed on chemical vapor deposited graphene microbridge (3 μm × 80 μm) under electrical current density up to 2.58 × 108 A/cm2 in ambient conditions. We found that both the G and the G′ peak of the Raman spectra do not restore back to the initial values at zero current, but to slightly higher values after switching off the current through the microbridge. The up-shift of the G peak and the G′ peak, after switching off the electrical current, is believed to be due to p-doping by oxygen adsorption, which is confirmed by scanning photoemission microscopy. Both C–O and C=O bond components in the C1s spectra from the microbridge were found to be significantly increased after high electrical current density was flown. The C=O bond is likely the main source of the p-doping according to our density functional theory calculation of the electronic structure. Copyright © 2014 John Wiley & Sons, Ltd.