TiO2 thin films for spintronics application: a Raman study (pages 558–565)
F. Rossella, P. Galinetto, M. C. Mozzati, L. Malavasi, Y. Diaz Fernandez, G. Drera and L. Sangaletti
Version of Record online: 25 SEP 2009 | DOI: 10.1002/jrs.2465
Micro-Raman spectroscopy is used for investigating TiO2 thin films sputtered on quartz substrates. The crystalline phases are determined. Mapping reveals good local and global crystalline homogeneity. In the mixed phase samples, the weights of the different phases are monitored. The effect of thermal treatments is highlighted, and the oxygen stoichiometry is derived. An interface layer between substrate and film is revealed, which can play a role in driving the magnetic properties of our samples and potentially useful for spintronics application.