Hysteresis analysis in excimer-laser-annealed low-temperature polycrystalline-silicon thin-film transistors (pages 355–359)Yu-Mi Kim, Kwang-Seok Jeong, Ho-Jin Yun, Seung-Dong Yang, Sang-Youl Lee, Moo-Jin Kim, Oh-Seob Kwon, Chul-Woo Jeong, Jae-Yong Kim, Sung-Chul Kim and Ga-Won Lee
Article first published online: 24 JUL 2012 | DOI: 10.1002/jsid.94