Full Paper
Nanocomposites Based on Layered Silicates and Epoxy Resins: Measurement of Clay Dispersion and Exfoliation using TEM, Solid-State NMR, and X-ray Diffraction Methods
Article first published online: 9 FEB 2012
DOI: 10.1002/macp.201100594
Copyright © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Additional Information
How to Cite
Jung, A., Peter, K., Demco, D. E., Jehnichen, D. and Moeller, M. (2012), Nanocomposites Based on Layered Silicates and Epoxy Resins: Measurement of Clay Dispersion and Exfoliation using TEM, Solid-State NMR, and X-ray Diffraction Methods. Macromol. Chem. Phys., 213: 389–400. doi: 10.1002/macp.201100594
Publication History
- Issue published online: 15 FEB 2012
- Article first published online: 9 FEB 2012
- Manuscript Received: 26 OCT 2011
- Abstract
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Keywords:
- exfoliation;
- layered silicates;
- 1H solid-state NMR;
- TEM;
- XRD
Abstract
In an epoxy/layered silicate nanocomposite containing different organically modified layered silicats, the effect of various organic modifications and the layered silicate content on the layer distances are investigated by transmission electron microscopy (TEM), X-ray diffraction (XRD) measurements, and 1H solid-state NMR. TEM micrographs were evaluated using a semi-quantitative method. The effect of paramagnetic impurities present in the clay is used to obtain overall sample information related to the degree of exfoliation by 1H solid-state NMR. A new model for determination of the degree of exfoliation by proton longitudinal relaxation rate measurements is developed.

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