Fluorinated Polyurethanes: XPS and AFM Characterization

Authors

  • M. Penoff,

    Corresponding author
    1. Composite Materials Group, Institute of Materials Science and Technology, University of Mar del Plata and National Research Council, J.B. Justo 4302, 7600 Mar del Plata, Argentina
    • Composite Materials Group, Institute of Materials Science and Technology, University of Mar del Plata and National Research Council, J.B. Justo 4302, 7600 Mar del Plata, Argentina.
    Search for more papers by this author
  • W. Schreiner,

    1. Surfaces and Interfaces Laboratory, Federal University of Parana, Politécnico, 81531-980 Curitiba, Paraná, Brazil
    Search for more papers by this author
  • P. Oyanguren,

    1. Nanomaterials Group, Institute of Materials Science and Technology, University of Mar del Plata and National Research Council, J.B. Justo 4302, 7600 Mar del Plata, Argentina
    Search for more papers by this author
  • P. Montemartini

    1. Composite Materials Group, Institute of Materials Science and Technology, University of Mar del Plata and National Research Council, J.B. Justo 4302, 7600 Mar del Plata, Argentina
    Search for more papers by this author

Abstract

Summary: Fluorinated polyurethane films were obtained from 5-isocyanato-1-(isocyanatomethyl)-1,3,3-trimethyl-cyclohexane (IPDI) and polyethylene oxide (PEO), employing two monoalcohols with different chain lenghts as fluorinated modifiers, 1H,1H,2H,2H-tridecafluoro-1-n-octanol (EA600) and 1H,1H,2H,2H-heptadecafluoro-1-n-decanol (EA800). X-ray photoelectron spectroscopy (XPS) has demonstrated that fluorine surface enrichment takes place. Atomic force microscopy (AFM) was employed in order to characterize films surfaces, in terms of topography and differences in hydrophobicity from light and moderate tapping conditions.

Ancillary