Sensitivity driven artificial neural network correction models for RF/microwave devices
Version of Record online: 1 DEC 2011
Copyright © 2011 Wiley Periodicals, Inc.
International Journal of RF and Microwave Computer-Aided Engineering
Special Issue: EM-CAD Models and their Integration into Industry-Standard CAD Tools Contributing to Engineering Design and Innovation
Volume 22, Issue 1, pages 30–40, January 2012
How to Cite
Devabhaktuni, V., Mareddy, L., Vemuru, S., Cheruvu, V., Goykhman, Y. and Ozdemir, T. (2012), Sensitivity driven artificial neural network correction models for RF/microwave devices. Int J RF and Microwave Comp Aid Eng, 22: 30–40. doi: 10.1002/mmce.20581
- Issue online: 14 DEC 2011
- Version of Record online: 1 DEC 2011
- Manuscript Accepted: 31 AUG 2011
- Manuscript Received: 31 MAR 2011
- College of Engineering at the University of Toledo
- EECS Department at the University of Toledo
- National Science Foundation. Grant Number: NSF Grant No. 1000744
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