Paper Presented at 26th EU PVSEC, Hamburg, Germany 2011
Polarisation analysis of luminescence for the characterisation of defects in silicon wafer solar cells
Article first published online: 2 NOV 2011
Copyright © 2011 John Wiley & Sons, Ltd.
Progress in Photovoltaics: Research and Applications
Special Issue: 26th EU PVSEC, Hamburg, Germany 2011
Volume 20, Issue 6, pages 661–669, September 2012
How to Cite
Peloso, M. P., Lew, J. S., Chaturvedi, P., Hoex, B. and Aberle, A. G. (2012), Polarisation analysis of luminescence for the characterisation of defects in silicon wafer solar cells. Prog. Photovolt: Res. Appl., 20: 661–669. doi: 10.1002/pip.1201
- Issue published online: 24 AUG 2012
- Article first published online: 2 NOV 2011
- Manuscript Accepted: 26 AUG 2011
- Manuscript Revised: 14 AUG 2011
- Manuscript Received: 29 MAY 2011
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