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    Masakazu Baba, Kosuke O. Hara, Daichi Tsukahara, Kaoru Toko, Noritaka Usami, Takashi Sekiguchi, Takashi Suemasu, Potential variation around grain boundaries in BaSi2 films grown on multicrystalline silicon evaluated using Kelvin probe force microscopy, Journal of Applied Physics, 2014, 116, 23, 235301

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    D. Tsukahara, M. Baba, S. Honda, Y. Imai, K. O. Hara, N. Usami, K. Toko, J. H. Werner, T. Suemasu, Potential variations around grain boundaries in impurity-doped BaSi2 epitaxial films evaluated by Kelvin probe force microscopy, Journal of Applied Physics, 2014, 116, 12, 123709

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