Impact of laterally non-uniform carrier lifetime on photoconductance-based lifetime measurements with self-consistent calibration
Article first published online: 21 JUN 2012
Copyright © 2012 John Wiley & Sons, Ltd.
Progress in Photovoltaics: Research and Applications
Volume 21, Issue 8, pages 1640–1644, December 2013
How to Cite
Liang, W. S., Weber, K. J. and Ren, Y. L. (2013), Impact of laterally non-uniform carrier lifetime on photoconductance-based lifetime measurements with self-consistent calibration. Prog. Photovolt: Res. Appl., 21: 1640–1644. doi: 10.1002/pip.2248
- Issue published online: 25 NOV 2013
- Article first published online: 21 JUN 2012
- Manuscript Accepted: 4 MAY 2012
- Manuscript Revised: 21 MAR 2012
- Manuscript Received: 20 NOV 2011
- lifetime measurement;
- non-uniform lifetime
The impact of laterally non-uniform carrier lifetime on the determination of the lifetime from photoconductance-based measurements, based on the self-consistent method proposed by Trupke and Bardos, is investigated using a simple model. It is shown that the method can result in an overestimation of the mean lifetime, with the magnitude of the error mainly dependent on the distribution of the effective lifetime across the area sensed by the photoconductance coil. Although in many cases the error introduced will be relatively small (in the order of 5% or less), much larger errors can result in some cases, such as for samples that feature small areas with a significantly higher than average lifetime. The error can be eliminated through independent measurement of the sample optical properties. Experimental measurements confirm the model predictions. Copyright © 2012 John Wiley & Sons, Ltd.