Insulated gate bipolar transistor reliability testing protocol for PV inverter applications
Article first published online: 16 JAN 2013
Published 2013. This article is a U.S. Government work and is in the public domain in the USA.
Progress in Photovoltaics: Research and Applications
How to Cite
Flicker, J., Kaplar, R., Yang, B., Marinella, M. and Granata, J. (2013), Insulated gate bipolar transistor reliability testing protocol for PV inverter applications. Prog. Photovolt: Res. Appl.. doi: 10.1002/pip.2351
- Article first published online: 16 JAN 2013
- Manuscript Accepted: 19 NOV 2012
- Manuscript Revised: 22 OCT 2012
- Manuscript Received: 1 MAY 2012
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