Insulated gate bipolar transistor reliability testing protocol for PV inverter applications
Article first published online: 16 JAN 2013
Published 2013. This article is a U.S. Government work and is in the public domain in the USA.
Progress in Photovoltaics: Research and Applications
Volume 22, Issue 9, pages 970–983, September 2014
How to Cite
2014), Insulated gate bipolar transistor reliability testing protocol for PV inverter applications, Prog. Photovolt: Res. Appl., 22, 970–983, doi: 10.1002/pip.2351, , , , and (
- Issue published online: 15 AUG 2014
- Article first published online: 16 JAN 2013
- Manuscript Accepted: 19 NOV 2012
- Manuscript Revised: 22 OCT 2012
- Manuscript Received: 1 MAY 2012
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