Characterization of high-efficiency c-Si CPV cells (pages 898–907)
Mauro Pravettoni, Roberto Galleano, Raffaele Fucci, Robert P. Kenny, Antonio Romano, Michele Pellegrino, Tuomas Aitasalo, Giovanni Flaminio, Carlo Privato, Willem Zaaiman and Ewan D. Dunlop
Article first published online: 28 MAR 2011 | DOI: 10.1002/pip.1101
This paper focuses on the following two essential components of device calibration. First, the preparation of traceable calibrated reference cells for checking device linearity at different concentration ratios. Second, it is also essential to implement common procedures and intercomparison of results at different test laboratories. Procedures and experimental setups for concentrating c-Si cell characterization at ESTI and at the UTTP FOTO Laboratory of ENEA are described and results of an intercomparison are presented and discussed.