Ellipsometry as a probe of crystallization kinetics in thin diblock copolymer films
Article first published online: 7 NOV 2006
Copyright © 2006 Wiley Periodicals, Inc.
Journal of Polymer Science Part B: Polymer Physics
Special Issue: The American Physical Society Division of Polymer Physics Special Issue
Volume 44, Issue 24, pages 3448–3452, 15 December 2006
How to Cite
Carvalho, J. L., Massa, M. V. and Dalnoki-Veress, K. (2006), Ellipsometry as a probe of crystallization kinetics in thin diblock copolymer films. J. Polym. Sci. B Polym. Phys., 44: 3448–3452. doi: 10.1002/polb.21006
- Issue published online: 7 NOV 2006
- Article first published online: 7 NOV 2006
- Manuscript Accepted: 23 AUG 2006
- Manuscript Revised: 24 JUL 2006
- Manuscript Received: 8 JUN 2006
- Natural Sciences and Engineering Research Council of Canada
REFERENCES AND NOTES
- 1The Encyclopedia of Nanoscience and Nanotechnology; Marcel Dekker: New York, 2002.
- 2In Developments in Block Copolymer Science and Technology; Hamley, I. W., Ed.; Wiley: West Sussex, England, 2004; p 213.;
- 6ACS Polym Prepr 1969, 10, 820.;
- 17Ellipsometry and Polarized Light; North Holland: Amsterdam, 1977.;
- 20To calculate the sphere radius in the smaller block length, we used the strong-stretching theory expression for the domain size, as described in ref. 21, based on a sphere radius and volume fraction for the longer block length, as given in ref. 19.
- 25These values for α were measured by ellipsometry for PB and PEO homopolymers. The values are consistent with those quoted for 1,4-addition PB and amorphous PEO in the literature (e.g., refs. 26 and 27).
- 27Physical Properties of Polymers Handbook; Mark, J. E., Ed.; American Institute of Physics: New York, 1996.