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In situ film characterization of thermally treated microstructured conducting polymer films

Robert Meier¹,
Hsin-Yin Chiang¹,
Matthias A. Ruderer¹,
Shuai Guo¹,
Volker Körstgens¹,
Jan Perlich²,
Peter Müller-Buschbaum^1,*

Article first published online: 5 FEB 2012

DOI: 10.1002/polb.23048

Issue

Journal of Polymer Science Part B: Polymer Physics

Volume 50, Issue 9, pages 631–641, 1 May 2012

Additional Information

How to Cite

Meier, R., Chiang, H.-Y., Ruderer, M. A., Guo, S., Körstgens, V., Perlich, J. and Müller-Buschbaum, P. (2012), In situ film characterization of thermally treated microstructured conducting polymer films. J. Polym. Sci. B Polym. Phys., 50: 631–641. doi: 10.1002/polb.23048

Author Information

¹
Technische Universität München, Physik-Department, Lehrstuhl für Funktionelle Materialien, James-Franck-Str. 1, 85748 Garching, Germany
²
HASYLAB at DESY, Notkestr. 85, 22603 Hamburg, Germany

Email: Peter Müller-Buschbaum (muellerb@ph.tum.de)

^*Technische Universität München, Physik-Department, Lehrstuhl für Funktionelle Materialien, James-Franck-Str. 1, 85748 Garching, Germany

Publication History

Issue published online: 26 MAR 2012
Article first published online: 5 FEB 2012
Manuscript Accepted: 17 JAN 2012
Manuscript Received: 15 NOV 2011

Funded by

BMBF. Grant Number: 05KS7W01
the Bavarian State Ministry of Sciences, Research and Arts through the International Graduate School “Materials Science of Complex Interfaces” (CompInt)

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In situ film characterization of thermally treated microstructured conducting polymer films

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In situ film characterization of thermally treated microstructured conducting polymer films

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