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Vertical confinement and interface effects on the microstructure and charge transport of P3HT thin films

  1. Leslie H. Jimison1,†,‡,
  2. Scott Himmelberger1,†,‡,
  3. Duc T. Duong1,
  4. Jonathan Rivnay1,
  5. Michael F. Toney2,
  6. Alberto Salleo1,*

Article first published online: 12 FEB 2013

DOI: 10.1002/polb.23265

Issue

Journal of Polymer Science Part B: Polymer Physics

Journal of Polymer Science Part B: Polymer Physics

Volume 51, Issue 7, pages 611–620, 1 April 2013

Additional Information

How to Cite

Jimison, L. H., Himmelberger, S., Duong, D. T., Rivnay, J., Toney, M. F. and Salleo, A. (2013), Vertical confinement and interface effects on the microstructure and charge transport of P3HT thin films. J. Polym. Sci. B Polym. Phys., 51: 611–620. doi: 10.1002/polb.23265

Author Information

  1. 1

    Materials Science and Engineering, Stanford University, 476 Lomita Mall, Stanford, California 94305

  2. 2

    Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Menlo Park, California 94025

  1. †

    Leslie H. Jimison and Jonathan Rivnay, Department of Bioelectronics, Ecole Nationale Supérieure des Mines, CMP-EMSE, MOC, 880 route de Mimet, 13541 Gardanne, France

  1. ‡

    Leslie H. Jimison and Scott Himmelberger contributed equally to this work.

*Materials Science and Engineering, 476 Lomita Mall, 239 McCullough Building, Stanford, California 94305

  1. ‡

    Leslie H. Jimison and Scott Himmelberger contributed equally to this work.

Publication History

  1. Issue published online: 26 FEB 2013
  2. Article first published online: 12 FEB 2013
  3. Manuscript Accepted: 18 JAN 2013
  4. Manuscript Revised: 17 JAN 2013
  5. Manuscript Received: 8 JAN 2013

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