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Additional Supporting Information may be found in the online version of this article.

FilenameFormatSizeDescription
polb23353-sup-0001-suppfig1.tif1746KFigure S1 displays the SEC data for S42 and A122, which are provided from Polymer Source Inc.
polb23353-sup-0002-suppfig2.tif7625KFigure S2 shows the AFM phase images of A122/S42 20/80. Perpendicular orientation was shown at the film thickness of 21 nm and 24 nm. But, the ordering of pattern differed with the mole fraction of styrene in the random brush. At the film thickness of 29.4 nm, perpendicular orientation was partially existed.
polb23353-sup-0003-suppfig3.tif6814KFigure S3 shows the AFM phase images of A122/S42 30/70. Perpendicular orientation was shown at the film thickness of 21 nm. But, the ordering of pattern differed with the mole fraction of styrene in the random brush like the case of A122/S42 20/80. At the film thickness of 26 nm, perpendicular orientation was getting disappeared as the mole fraction of styrene in the random brush increased.
polb23353-sup-0004-suppfig4.tif5971KFigure S4 shows the AFM phase images of A122/S42 40/60. When the mole fraction of styrene in the random brush was 0.65, perpendicular orientation was kept until the film thickness reached at 33nm. When mole fraction of styrene in the random brush was 0.68, perpendicular orientation was shown at the film thickness of 29 nm. However, we did not find the film thickness to induce the expected orientation at 0.71 mole fraction of styrene in the random brush.
polb23353-sup-0005-suppinfo.docx5768KSupporting Information.

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