Original Paper
InGaN/GaN resonant-cavity LED including an AlInN/GaN Bragg mirror
Article first published online: 10 SEP 2004
DOI: 10.1002/pssa.200405042
Copyright © 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Additional Information
How to Cite
Dorsaz, J., Carlin, J.-F., Zellweger, C. M., Gradecak, S. and Ilegems, M. (2004), InGaN/GaN resonant-cavity LED including an AlInN/GaN Bragg mirror. phys. stat. sol. (a), 201: 2675–2678. doi: 10.1002/pssa.200405042
Publication History
- Issue published online: 10 SEP 2004
- Article first published online: 10 SEP 2004
- Manuscript Accepted: 8 JUL 2004
- Manuscript Received: 25 FEB 2004
- Abstract
- References
- Cited By
Keywords:
- 81.05.Ea;
- 85.60.Bt;
- 85.60.Jb
Abstract
We report on the growth by metalorganic vapor phase epitaxy of a InGaN/GaN resonant-cavity light emitting diode (RCLED) emitting at 454 nm and incorporating a 12-pair Al0.82In0.18N/GaN distributed Bragg reflector as bottom mirror. A1–xInxN layers with an Al content around x ∼ 0.17 are lattice matched to GaN, thus avoiding strain-related issues in the subsequent active layers while keeping a high refractive index contrast of 7%, comparable to that achievable in the Al0.5Ga0.5N/GaN system. Devices exhibit clear resonant-cavity effects, improved directionality in the radiation pattern and achieve an optical output of 1.7 mW and 2.6% external quantum efficiency at 20 mA. (© 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)

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