Original Paper

In situ observation of the evolution of porous silicon interference filter characteristics

  1. J. Volk1,*,
  2. K. Ferencz2,
  3. J. J. Ramsden3,
  4. A. L. Tóth1,
  5. I. Bársony1

Article first published online: 3 JUN 2005

DOI: 10.1002/pssa.200461234

Issue

physica status solidi (a)

physica status solidi (a)

Volume 202, Issue 8, pages 1703–1706, June 2005

Additional Information

How to Cite

Volk, J., Ferencz, K., Ramsden, J. J., Tóth, A. L. and Bársony, I. (2005), In situ observation of the evolution of porous silicon interference filter characteristics. physica status solidi (a), 202: 1703–1706. doi: 10.1002/pssa.200461234

Author Information

  1. 1

    Research Institute for Technical Physics and Materials Science MFA, P.O. Box 49, 1525 Budapest, Hungary

  2. 2

    Research Institute for Solid State Physics and Optics SZFKI, P.O. Box 49, 1525 Budapest, Hungary

  3. 3

    Department of Advanced Materials, Cranfield University, MK43 0AL, UK

*Phone: +36 1 392 2694, Fax: +36 1 392 2226

Publication History

  1. Issue published online: 3 JUN 2005
  2. Article first published online: 3 JUN 2005
  3. Manuscript Accepted: 27 JAN 2005
  4. Manuscript Revised: 13 SEP 2004
  5. Manuscript Received: 10 JUN 2004

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Keywords:

  • 42.79.Ci;
  • 78.30.Am;
  • 82.45.Vp

Abstract

Porous silicon multilayer formation was observed by in situ monitoring of the reflectivity spectra in the visible range. In order to reproduce the formation process optical model simulation was carried out. For demonstration of this method a 24-layer microcavity structure was selected. Although in this low wavelengths region some absorption and scattering effects complicate the overall picture, the combined analysis throws new light upon the evolution of the porous silicon multilayer. (© 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)

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