Piezoreflectance and photoreflectance study of annealing effects on GaAs0.916Sb0.084 and GaAs0.906Sb0.075N0.019 films on GaAs grown by gas-source molecular beam epitaxy
Version of Record online: 23 MAR 2009
Copyright © 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
physica status solidi (a)
Volume 206, Issue 5, pages 830–835, May 2009
How to Cite
Hsu, H. P., Huang, Y. N., Huang, Y. S., Lin, Y. T., Ma, T. C., Lin, H. H., Tiong, K. K., Sitarek, P. and Misiewicz, J. (2009), Piezoreflectance and photoreflectance study of annealing effects on GaAs0.916Sb0.084 and GaAs0.906Sb0.075N0.019 films on GaAs grown by gas-source molecular beam epitaxy. Phys. Status Solidi A, 206: 830–835. doi: 10.1002/pssa.200881409
- Issue online: 5 MAY 2009
- Version of Record online: 23 MAR 2009
- Manuscript Accepted: 24 NOV 2008
- Manuscript Revised: 19 NOV 2008
- Manuscript Received: 3 JUL 2008
- National Science Council of Taiwan. Grant Number: NSC 96-2221-E-011-030
- exchange program between the NSC and PAS. Grant Number: NSC96-2911-I-011-003
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