Effect of rapid thermal annealing on the electrical and structural properties of Ru/n-InP (100) Schottky rectifiers
Article first published online: 22 JUN 2009
Copyright © 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
physica status solidi (a)
Volume 206, Issue 11, pages 2658–2664, November 2009
How to Cite
Janardhanam, V., Kumar, A. A., Reddy, M. B., Reddy, V. R., Reddy, P. N., Balamurugan, A. K. and Tyagi, A. K. (2009), Effect of rapid thermal annealing on the electrical and structural properties of Ru/n-InP (100) Schottky rectifiers. Phys. Status Solidi A, 206: 2658–2664. doi: 10.1002/pssa.200925173
- Issue published online: 6 NOV 2009
- Article first published online: 22 JUN 2009
- Manuscript Accepted: 18 MAY 2009
- Manuscript Revised: 15 MAY 2009
- Manuscript Received: 9 APR 2009
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