Electron-beam induced phase transformation in β-Ag2Se thin films

Authors

  • Kuibo Yin,

    1. National Laboratory of Solid State Microstructures, Department of Materials Science and Engineering, Nanjing University, Nanjing 210093, P.R. China
    2. Key Laboratory of MEMS of Ministry of Education, Southeast University, Nanjing 210096, P.R. China
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  • Yidong Xia,

    1. National Laboratory of Solid State Microstructures, Department of Materials Science and Engineering, Nanjing University, Nanjing 210093, P.R. China
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  • Zhiguo Liu,

    Corresponding author
    1. National Laboratory of Solid State Microstructures, Department of Materials Science and Engineering, Nanjing University, Nanjing 210093, P.R. China
    • Phone: +86 25 8359 5979, Fax: +86 25 8359 5535
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  • Jiang Yin,

    1. National Laboratory of Solid State Microstructures, Department of Materials Science and Engineering, Nanjing University, Nanjing 210093, P.R. China
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  • Litao Sun

    1. Key Laboratory of MEMS of Ministry of Education, Southeast University, Nanjing 210096, P.R. China
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Abstract

The microstructure of room-temperature silver selenide thin films prepared by pulsed laser deposition (PLD) was investigated by transmission electron microscope (TEM). Two phases existed in room-temperature silver selenide. One was orthorhombic phase (O) and the other was identified as monoclinic phase (M) by TEM tilting experiments. The monoclinic phase can transform to orthorhombic phase along [100]M direction under the irradiation of electron beam. Thermal stress induced by the difference of coefficient of thermal expansion (CTE) of Ag2Se and Cu gridding/NaCl substrate is thought to play an important role in this phase transformation.

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