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    Yingjie Zhang, Dominik Ziegler, Miquel Salmeron, Charge Trapping States at the SiO2–Oligothiophene Monolayer Interface in Field Effect Transistors Studied by Kelvin Probe Force Microscopy, ACS Nano, 2013, 7, 9, 8258

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  2. 2
    Manfred Gruber, Egbert Zojer, Ferdinand Schürrer, Karin Zojer, Impact of Materials versus Geometric Parameters on the Contact Resistance in Organic Thin-Film Transistors, Advanced Functional Materials, 2013, 23, 23