A re-examination of cobalt-related defects in n- and p-type silicon
Article first published online: 23 JUL 2012
Copyright © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
physica status solidi (a)
Volume 209, Issue 10, pages 1913–1916, October 2012
How to Cite
Scheffler, L., Kolkovsky, V. and Weber, J. (2012), A re-examination of cobalt-related defects in n- and p-type silicon. Phys. Status Solidi A, 209: 1913–1916. doi: 10.1002/pssa.201200140
- Issue published online: 15 OCT 2012
- Article first published online: 23 JUL 2012
- Manuscript Accepted: 31 MAY 2012
- Manuscript Revised: 22 MAY 2012
- Manuscript Received: 4 MAY 2012
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