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    R.R. Lieten, J.C. McCallum, B.C. Johnson, Single crystalline SiGe layers on Si by solid phase epitaxy, Journal of Crystal Growth, 2015, 416, 34

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    D. J. Norris, Y. Qiu, A. Dobbie, M. Myronov, T. Walther, Similarity of Stranski-Krastanow growth of Ge/Si and SiGe/Si (001), Journal of Applied Physics, 2014, 115, 1, 012003

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    Y Qiu, V H Nguyen, A Dobbie, M Myronov, T Walther, Calibration of thickness-dependentk-factors for germanium X-ray lines to improve energy-dispersive X-ray spectroscopy of SiGe layers in analytical transmission electron microscopy, Journal of Physics: Conference Series, 2013, 471, 012031

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