Electrical characterization of defects introduced in n-Si during electron beam deposition of Pt
Article first published online: 1 OCT 2012
Copyright © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
physica status solidi (a)
Volume 209, Issue 10, pages 1926–1933, October 2012
How to Cite
Auret, F. D., Coelho, S. M. M., Nel, J. M. and Meyer, W. E. (2012), Electrical characterization of defects introduced in n-Si during electron beam deposition of Pt. Phys. Status Solidi A, 209: 1926–1933. doi: 10.1002/pssa.201200578
- Issue published online: 15 OCT 2012
- Article first published online: 1 OCT 2012
- Manuscript Accepted: 13 SEP 2012
- Manuscript Received: 15 AUG 2012
- South African National Research Foundation
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