Thermionic emission characterization of boron-doped microcrystalline diamond films at elevated temperatures
Version of Record online: 4 JUN 2012
Copyright © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
physica status solidi (a)
Volume 209, Issue 10, pages 1993–1995, October 2012
How to Cite
Paxton, W. F., Wade, T., Howell, M., Tolk, N., Kang, W. P. and Davidson, J. L. (2012), Thermionic emission characterization of boron-doped microcrystalline diamond films at elevated temperatures. Phys. Status Solidi A, 209: 1993–1995. doi: 10.1002/pssa.201228114
- Issue online: 15 OCT 2012
- Version of Record online: 4 JUN 2012
- Manuscript Accepted: 14 MAY 2012
- Manuscript Revised: 8 MAY 2012
- Manuscript Received: 22 FEB 2012
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