Original Paper
Electrical properties of individual GaP nanowires doped by zinc
Article first published online: 1 OCT 2012
DOI: 10.1002/pssa.201228255
Copyright © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Additional Information
How to Cite
Novak, J., Šoltýs, J., Eliáš, P., Hasenöhrl, S., Stoklas, R., Dujavová, A. and Mikulics, M. (2012), Electrical properties of individual GaP nanowires doped by zinc. Phys. Status Solidi A, 209: 2505–2509. doi: 10.1002/pssa.201228255
Publication History
- Issue published online: 12 DEC 2012
- Article first published online: 1 OCT 2012
- Manuscript Accepted: 14 SEP 2012
- Manuscript Revised: 5 SEP 2012
- Manuscript Received: 20 APR 2012
- Abstract
- Article
- References
- Cited By
Keywords:
- GaP nanowires;
- MOVPE;
- zinc doping
Abstract
Gallium phosphide nanowires (NWs) doped by zinc were prepared on (111)B GaP substrates by low-pressure metal-organic vapor phase epitaxy using 30 nm Au seed particles. The NWs were transferred onto SiO2/Si substrate. Single NWs were processed into two- and four-probe back-gated devices electrically contacted via low-resistance ohmic contacts, formed by evaporation of Au + Zn alloy that was annealed at 400 °C. The device topology was defined using electron beam lithography (EBL) and lift-off. The NW electrical properties were evaluated from I–V characteristics measured for various gate voltages. The measurement gave evidence that the NW were p-type. The NW resistivity and hole concentration were between 0.254 and 0.325 Ωcm, and 0.9–1.5 × 1018 cm−3, respectively.

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