SEARCH

SEARCH BY CITATION

Cited in:

CrossRef

This article has been cited by:

  1. 1
    S. Liu, F. Liu, X.Q. Zhu, Y. Bai, D.Y. Ma, F. Ma, K.W. Xu, Limited grain growth in multilayered Bi/Te thin films and the influence on the thermal and electrical conductivity, Vacuum, 2016, 127, 88

    CrossRef

  2. 2
    Sebastian Goerke, Mario Ziegler, Andreas Ihring, Jan Dellith, Andreas Undisz, Marco Diegel, Solveig Anders, Uwe Huebner, Markus Rettenmayr, Hans-Georg Meyer, Atomic layer deposition of AlN for thin membranes using trimethylaluminum and H2/N2 plasma, Applied Surface Science, 2015, 338, 35

    CrossRef

  3. 3
    A. D. Avery, S. J. Mason, D. Bassett, D. Wesenberg, B. L. Zink, Thermal and electrical conductivity of approximately 100-nm permalloy, Ni, Co, Al, and Cu films and examination of the Wiedemann-Franz Law, Physical Review B, 2015, 92, 21

    CrossRef

  4. 4
    M. T. Alam, S. King, M. A. Haque, Characterization of very low thermal conductivity thin films, Journal of Thermal Analysis and Calorimetry, 2014, 115, 2, 1541

    CrossRef

  5. 5
    Philip Sergelius, Josep M Montero Moreno, Wehid Rahimi, Martin Waleczek, Robert Zierold, Detlef Görlitz, Kornelius Nielsch, Electrochemical synthesis of highly ordered nanowires with a rectangular cross section using an in-plane nanochannel array, Nanotechnology, 2014, 25, 50, 504002

    CrossRef

  6. 6
    Zhe Luo, Han Liu, Bryan T. Spann, Yanhui Feng, Peide Ye, Yong P. Chen, Xianfan Xu, Measurement of In-Plane Thermal Conductivity of Ultrathin Films Using Micro-Raman Spectroscopy, Nanoscale and Microscale Thermophysical Engineering, 2014, 18, 2, 183

    CrossRef

  7. You have free access to this content7
    Christian Heiliger, Bruno K. Meyer, Advances in Thermoelectric Materials, physica status solidi (a), 2013, 210, 1
  8. 8
    Hossein Ftouni, Dimitri Tainoff, Jacques Richard, Kunal Lulla, Jean Guidi, Eddy Collin, Olivier Bourgeois, Specific heat measurement of thin suspended SiN membrane from 8 K to 300 K using the 3ω-Völklein method, Review of Scientific Instruments, 2013, 84, 9, 094902

    CrossRef

  9. 9
    F. Völklein, H. Reith, A. Meier, M. Schmitt, Measuring Techniques for Thermal Conductivity and Thermoelectric Figure of Merit of V–VI Compound Thin Films and Nanowires,